©2018 Impressum | Data Privacy Statement | Sitemap You are here » Outreach » Press/News

Latest News

13.06.2018 00:00 - Update CODE of Conduct - Nano Quarz Wafer GmbH

Beyond the DIN EN ISO 9001:2015 we observe in addition the CODE of Conduct from Nano Quarz Wafer....

11.01.2018 00:00 - NQW use knowledge-based manufacturing and engineering system to achieving the customer requirements

Our R&D, engineering and manufacturing capabilities enable us to design and manufacture...

31.12.2017 00:00 - Looking forward to 2018

We wish all employees, customers and suppliers a pleasant start into 2018.


Tag Cloud


Für die ordnungsgemäße Darstellung dieser Applikation wird Flash und Javascript benötigt.

20. February 2016 00:00
Category: Events

NQW today announced that it has a new geometry instrument and DIC microscope successfully installed.

NQW today announced that it has a new geometry instrument and DIC microscope successfully installed. With the new measurement tool able 4” up to 8” wafers of different substrates / materials are measured. The measuring principle is based on a confocal sensor measuring head with very high submicron resolution. NQW can improve the product testing with the device and support the technological developments and challenges quantitatively & qualitatively.

For more information you may contact us at 09101 90 220 200 or via email: info@nanoquarzwafer.com.