NQW today announced that it has a new geometry instrument and DIC microscope successfully installed. With the new measurement tool able 4” up to 8” wafers of different substrates / materials are measured. The measuring principle is based on a confocal sensor measuring head with very high submicron resolution. NQW can improve the product testing with the device and support the technological developments and challenges quantitatively & qualitatively.
For more information you may contact us at 09101 90 220 200 or via email: info@nanoquarzwafer.com.
